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Research
HoloCam | LDL | 3DMA | HEW | OFM | P-DH-PALM | DH-PALM | Locate | Track | DH-PSF | QSIP
High-resolution Extended-depth Wide-field (HEW) imaging
Resolution, field of view, and depth of field are tightly constrained parameters in traditional optical microscopes. In these microscopes, any increase in resolution necessarily comes with a decrease in depth of field, together with a decrease in the maximum possible field of view. Here, we propose a high resolution microscope with a wide field of view and an extended depth of field. Our system illuminates a thick sample with a series of non-diffracting Bessel beams, and images the sample on a sensor directly or with an inexpensive lens. By scanning the sample under investigation, the system proposes to acquire two dimensional images of large areas of the sample, while promptly showing intricate high resolution details, even those that are well outside the focal plane. [See US20110205352]
